ABOUT ONE INNOVATION METHOD OF LOCALIZATION OF INDEPENDENT DIGITAL DEVICES

Authors

  • Siddikov IM k.t.n., senior teacher of KGPI
  • Махкамова Д.Х Master of KGPI
  • Sheraliev O.Sh Master of KGPI

Keywords:

Test diagnostics of digital devices, localization of faults, sequence of control tests, support test

Abstract

The process of test diagnostics of digital devices at the stage of production is discussed. Proposed method of support tests.

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Published

2021-03-01

Issue

2021: Scientise-2021

Section

Articles

License

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.